Fraunhofer植物計算機斷層掃描系統(tǒng)采用微焦點X射線成像原理進行分辨率三維成像,可以在不破壞樣品(無需染色、無需切片)的情況下,獲得高精度三維圖像,顯示樣品內(nèi)部詳盡的三維信息,并進行結(jié)構(gòu)、密度的定量分析,適用于觀察植物化石樣品結(jié)構(gòu)和植物活體組織的細胞結(jié)構(gòu),近年來被廣泛應(yīng)用于結(jié)構(gòu)學(xué)、組織學(xué)、生物學(xué)特別是古生物學(xué)等研究領(lǐng)域,例如花、果實、種子、根系等研究。
Fraunhofer研究院是世界先進的應(yīng)用技術(shù)研究院,很多工業(yè)技術(shù)都源自于該研究所。Fraunhofer專門成立的植物表型CT研究組致力于CT技術(shù)應(yīng)用在植物的表型研究上。與傳統(tǒng)醫(yī)學(xué)CT不同,植物CT研究需要獨特算法和軟件等,F(xiàn)raunhofer研究院在該研究領(lǐng)域位于世界前沿。
近年來,F(xiàn)raunhofer團隊一直致力于將計算機斷層掃描技術(shù)應(yīng)用于植物表型研究領(lǐng)域,特別是專注于植物結(jié)構(gòu)高分辨率無損檢測。其中一個研究方向為研究外在脅迫因素對植物微觀結(jié)構(gòu)的影響,研究方向有木質(zhì)部結(jié)構(gòu)如何對脅迫,如干旱做出反應(yīng)。在干旱環(huán)境下,一些植物不再為葉片或整個枝條提供水分。研究另外一個方向是不同植物基因品系的內(nèi)部微觀結(jié)構(gòu)特征。
Fraunhofer開發(fā)出了便攜式、臺式、落地式以及高通量等多個系列專門針對植物表型研究開發(fā)的計算機斷層掃描系統(tǒng)。
Drought and heat stress tolerance screening in wheat using computed tomography
Jessica Schmidt1, Joelle Claussen2*,Norbert Wörlein2, Anja Eggert2, Delphine Fleury1,3, Trevor Garnett1and Stefan Gerth2
Abstract
Background:
Improving abiotic stress tolerance in wheat requires large scale screening of yield components such as seed weight, seed number and single seed weight, all of which is very laborious, and a detailed analysis of seed mor- phology is time-consuming and visually often impossible. Computed tomography offers the opportunity for much
faster and more accurate assessment of yield components.
Results: An X-ray computed tomographic analysis was carried out on 203 very diverse wheat
accessions ,which have been exposed to either drought or combined drought and heat stress. Results demonstrated that
our computed tomography pipeline was capable of evaluating grain set with an accuracy of 95–99%. Most accessions exposed
to combined drought and heat stress developed smaller, shrivelled seeds with an increased seed surface. As expected, seed weight and seed number per ear as well as single seed size were significantly reduced under
combined drought and heat compared to drought alone. Seed weight along the ear was significantly reduced at the top and bottom of the wheat spike.
Conclusions: We were able to establish a pipeline with a higher throughput with scanning times of 7 min per ear
and accuracy than previous pipelines predicting a set of agronomical important seed traits and to visualize even more complex traits such as seed deformations. The pipeline presented here could be scaled up to use for
high throughput,high resolution phenotyping of tens of thousands of heads, greatly accelerating breeding
efforts to improve abiotic stress tolerance.
Keywords: X-ray, High-throughput, Phenotyping, Yield, Seed morphology, Genetic diversity